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Specializing in Fault Localization tools: Scanning Optical Microscopes, Photo Emission Microscopes, SEM Accessories for IC failure analysis |
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EDS with liquid nitrogen (LN2) free Xflash Silicon Drift Detector (SDD) with specialized Hybrid Pulse Processor technology providing both high energy resolutions up to 125eV and higher acquisition speed than LN-2-Si-Li detector |
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Sample Preparation for SEM applications, Critical Point Dryers, Plasma Etching and Cleaning Applications. |
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Supply of Consumables, Accessories and specialized equipment for Microscopy |
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Surface Analysis tools - X-Ray Photoelectron Spectroscopy (XPS), Auger Electron Spectroscopy and accessories for surface analysis |
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World Leader in X-Ray Optical and high performance X-Ray imaging systems. Capable of providing a 3-D X-Ray Tomography system that allows for high resolution imaging for semiconductor and disk drive applications. |
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Providing high precision micro and nano systems for IC-testing, materials testing Cryo stages, probe module for scanning electron microscope and FIB applications. |
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A one-stop analytical lab solution provider for semiconductors, physical failure analysis techniques - SEM/EDX - Scanning Augor Microscopy and Sample Preparation for a wide range of applications. |
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Photovoltaics Fast EL Mapping and NIR Imaging, Electron Microscopy, Real-time X-Ray Imaging, Raman Microscopy, Scanning Acoustic Microscopy, X-Ray Microanalysis, Light Microscopy, Meterology, Sample Preparation, Plasma, and Probe Card Conditioning. |
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- Pre-engineered, Low Frequency, Vibration Isolation Workstations
- Vibration Control Tables & Platforms for Tabletop & Floor-mounted Equipment
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Failure Analysis:
- Thermal Test Systems
- Dual Cold Plate Fixture
- Wind Tunnel
- Thermal Test Boards
- Thermal Testing Services
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IS 2003 Scanning Electron Microscope |
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